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Microscopy of Semiconducting Materials : Proceedings of the 14th conference, April 11-14, 2005, Oxford, UK

This is a long-established and well-respected biannual conference series, organized in conjunction with the Royal Microscopical Society Oxford and the Institute of Physics, London. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy; the latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction; and developments in materials science and technology covering the complete range of elemental and compound semiconductors are described.